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Precitech

TET MAKINA is the authorised sales contact for PRECITECH in Turkey.
Precitec
have been working in the field of optical measuring technology since the day
Precitec Optronik (former known as JURCA) was founded. Today we develop and
produce in three areas:
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medical
technology
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contactless measuring technology
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laser
materials processing
Sensors and complete measuring systems for various applications. Our core
areas of expertise are in opto-electronics, analog and digital technology,
and image processing.
JURCA was founded in 1982 as an engineering bureau. We have been a GmbH
since 1993. In November of 2000, we reorganized into Jurca Optoelektronik
GmbH & Co. KG. From an original staff of 3, we have grown to 26 employees at
present, half of whom are active in research and development.
Since July 1st, 2003 Jurca Optoelektronik GmbH & Co. KG continues its work
under the new name Precitec Optronik GmbH which is to emphasize our
affiliation to Precitec KG. Nevertheless, we still offer products for
camera-based process control and optical distance measurement technology. We
have worked closely together with Precitec KG for over 14 years. Precitec
produces and sells innovative products for laser processing and process
control throughout the world.
To ensure the quality of our products, we introduced a quality management
system according to DIN EN ISO 9001 in 1998. We have been certified since
November of 1999. Our QM system was successfully expanded in February of
2001 in accordance with the guidelines of EN 46001 for medical products.
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Measuring Technology |
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CHRocodile |
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CHR
150 E |
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Precitec Optronik Mark III |
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NEMESIS |
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NEMESIS P |
CHR 150
E
Contactless Measurement of Distances and Layer
Thicknesses
The
high measurement precision and sturdy construction of the measuring head and
the independence of the measurement from the condition of the object surface
allow the CHR 150 E to be used both in the laboratory and in the factory.
Properties
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A
scanning rate of 1 kHz at a resolution 10 nm over a measuring range of 300
µm
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The
angle of the measuring head can be adjusted over a wide range for normal
and reflective surfaces (90° ± 30° )
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White-light measurement (measurement results not falsified by speckled
images)
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The
confocal measurement principle eliminates fading at the edges
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Typical
applications:
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measurement of surfaces and transparent layers
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topographical measurements of microstructures
Easily integrated into automated measuring systems to meet individual
customer requirements.
Precitec Optronik Mark
III
Analysis of 3D and 2D surface data.
Properties
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Analysis
of 3D and 2D surface data, 3D viewing from many sides, cross-sectional
profiles, various filter functions
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Calculation of roughness, waviness, height distributions, load curves,
particle sizes
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Area and
volume calculations, measurement of distances, angles, radii of curvature,
polynomial and aspherical fits
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Support
provided for the file formats of many commercial surface measuring
systems, including ASCII, Burleigh, RM600, Perthometer, etc.
Range of Functions of the Precitec Optronik Mark
III
File
Formats
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ASCII,
Burleigh, Digital Instruments, FRT, Hommelwerke, Perthometer, PSI, RM600,
SIS, Veeco, and other formats are supported.
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TIFF,
GIF, BMP, and JPEG files can be imported.
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Diagrams
can be exported as BMP (8-bit), GIF, TIFF, or JEPG files for preparing
documentation.
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Views
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3D
views from multiple angles
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grid model
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virtual light source
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2D
plan view
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any
desired cross-sectional profile
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dynamic profile
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zoom
function for area selection
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many
different color tables available
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scaling functions
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diagram captioning function
Filter Functions
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smoothing filter, median filter
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Sobel and Roberts operators for edge enhancement
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derivation
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Fourier space filters
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removal of spikes
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correction of invalid data
Modification Functions
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subtraction of lines and planes
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0-6th-order polynomials
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3-point plane subtraction
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subtraction by lines or columns
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modification of lines and columns
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user-defined arithmetic functions
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Analysis Functions
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measurement of:
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areas, volumes
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distances, angles
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determination of roughness and waviness according to DIN / ISO
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determination of MOTIF roughness values
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fitting functions
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0-6th-order polynomials
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Aspheric function
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Trigonometric function
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determination of
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histogram (height distribution)
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load curve
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particle size
Minimum system requirements
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IBM
compatible PC
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Windows 95 / 98
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16
MB RAM (recommended 32 MB)
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Monitor resolution 800 x 600 (recommended 1024 x 768)
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Parallel port LPT 1
Scope
of delivery
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installation media
(CD-ROM or 1.44 MB diskettes)
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manual (German / English)
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hardware key (dongle)
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NEMESIS
P
Optical 3D measuring system
- Portable topographical measuring system -
NEMESIS P is a high-precision, 3D measuring system for the contactless
measurement of topographies, profiles, and layer thicknesses. The use of
linear axes with piezoelectric linear motors guarantees maintenance-free
operation in the laboratory and in the factory.
Sensor
The CHR 150 E optical sensor is used to record the measurements. The use of
chromatic encoding with white light makes it possible to measure distances
and thicknesses without contact, regardless of the texture or color of the
surface.
Software
The "Multitop" control software runs under Windows XP to control the course
of the measurement process and the recording of the data by the measuring
system. The Precitec Optronik MARK III software package makes it possible to
perform comprehensive analyses of the topographical and profile data thus
recorded.
Areas of
Application
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manufacturing and process control
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quality
assurance
research and development
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NEMESIS P |
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Travel |
25 mm x 25 mm |
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Maximum travel speed |
20 mm/s |
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Positioning accuracy in travel direction, per axis |
± 1 µm |
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Flatness/straightness per axis |
± 0,5 µm |
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Z axis |
manual adjustment |
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Sensor *) |
CHR 150 E |
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Weight |
2,250 g |
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*) Resolution and measurement accuracy
depend on the measuring range of the sensor head: |
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Measuring range |
300 µm |
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Resolution in Z |
10 nm |
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Measurement accuracy |
100 nm |
NEMESIS
Optical
surface measurement
with the
CHR 150
E
optical distance sensor
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topographies measured regardless of the nature of the surface (smooth and
polished, rough, matte, transparent)
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dimensional monitoring of ultra-small components and microstructures
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thickness layer measurement of transparent objects
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determination of roughness, waviness, load curves
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measuring of optical components
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