Title Here

















 

Home >> Represantations >> Precitech


TET MAKINA is the  authorised sales contact for PRECITECH in Turkey.
 

Precitec have been working in the field of optical measuring technology since the day Precitec Optronik (former known as JURCA) was founded. Today we develop and produce in three areas:

  • medical technology 
  • contactless measuring technology 
  • laser materials processing 

Sensors and complete measuring systems for various applications. Our core areas of expertise are in opto-electronics, analog and digital technology, and image processing.
JURCA was founded in 1982 as an engineering bureau. We have been a GmbH since 1993. In November of 2000, we reorganized into Jurca Optoelektronik GmbH & Co. KG. From an original staff of 3, we have grown to 26 employees at present, half of whom are active in research and development.

Since July 1st, 2003 Jurca Optoelektronik GmbH & Co. KG continues its work under the new name Precitec Optronik GmbH which is to emphasize our affiliation to Precitec KG. Nevertheless, we still offer products for camera-based process control and optical distance measurement technology. We have worked closely together with Precitec KG for over 14 years. Precitec produces and sells innovative products for laser processing and process control throughout the world.

To ensure the quality of our products, we introduced a quality management system according to DIN EN ISO 9001 in 1998. We have been certified since November of 1999. Our QM system was successfully expanded in February of 2001 in accordance with the guidelines of EN 46001 for medical products.

Measuring Technology

 CHRocodile

 CHR 150 E

 Precitec Optronik Mark III

 NEMESIS
 NEMESIS P

CHR 150 E
Contactless Measurement of Distances and Layer Thicknesses

The high measurement precision and sturdy construction of the measuring head and the independence of the measurement from the condition of the object surface allow the CHR 150 E to be used both in the laboratory and in the factory.

Properties

  • A scanning rate of 1 kHz at a resolution 10 nm over a measuring range of 300 µm
  • The angle of the measuring head can be adjusted over a wide range for normal and reflective surfaces (90° ± 30° )
  • White-light measurement (measurement results not falsified by speckled images)
  • The confocal measurement principle eliminates fading at the edges
  • Typical applications:
    • measurement of surfaces and transparent layers
    • topographical measurements of microstructures

Easily integrated into automated measuring systems to meet individual customer requirements.

Precitec Optronik Mark III
Analysis of 3D and 2D surface data.


Properties

  • Analysis of 3D and 2D surface data, 3D viewing from many sides, cross-sectional profiles, various filter functions
  • Calculation of roughness, waviness, height distributions, load curves, particle sizes
  • Area and volume calculations, measurement of distances, angles, radii of curvature, polynomial and aspherical fits
  • Support provided for the file formats of many commercial surface measuring systems, including ASCII, Burleigh, RM600, Perthometer, etc.



Range of Functions of the Precitec Optronik Mark
III

File Formats

  • ASCII, Burleigh, Digital Instruments, FRT, Hommelwerke, Perthometer, PSI, RM600, SIS, Veeco, and other formats are supported.
  • TIFF, GIF, BMP, and JPEG files can be imported.
  • Diagrams can be exported as BMP (8-bit), GIF, TIFF, or JEPG files for preparing documentation.

Views

  • 3D views from multiple angles
    • grid model
    • virtual light source
  • 2D plan view
  • any desired cross-sectional profile
  • dynamic profile
  • zoom function for area selection
  • many different color tables available
  • scaling functions
  • diagram captioning function

Filter Functions

  • smoothing filter, median filter
  • Sobel and Roberts operators for edge enhancement
  • derivation
  • Fourier space filters
  • removal of spikes
  • correction of invalid data

Modification Functions

  • subtraction of lines and planes
    • 0-6th-order polynomials
    • 3-point plane subtraction
    • subtraction by lines or columns
  • modification of lines and columns
    • averaging
    • replacement
  • user-defined arithmetic functions

Analysis Functions

  • measurement of:
    • areas, volumes
    • distances, angles
  • determination of roughness and waviness according to DIN / ISO
  • determination of MOTIF roughness values
  • fitting functions
    • 0-6th-order polynomials
    • Aspheric function
    • Trigonometric function
  • determination of
    • histogram (height distribution)
    • load curve
    • particle size

Minimum system requirements

  • IBM compatible PC
  • Windows 95 / 98
  • 16 MB RAM (recommended 32 MB)
  • Monitor resolution 800 x 600 (recommended 1024 x 768)
  • Parallel port LPT 1

Scope of delivery

  • installation media
    (CD-ROM or 1.44 MB diskettes)
  • manual (German / English)
  • hardware key (dongle)

NEMESIS P
Optical 3D measuring system
- Portable topographical measuring system -

NEMESIS P is a high-precision, 3D measuring system for the contactless measurement of topographies, profiles, and layer thicknesses. The use of linear axes with piezoelectric linear motors guarantees maintenance-free operation in the laboratory and in the factory.

Sensor

The CHR 150 E optical sensor is used to record the measurements. The use of chromatic encoding with white light makes it possible to measure distances and thicknesses without contact, regardless of the texture or color of the surface.

Software

The "Multitop" control software runs under Windows XP to control the course of the measurement process and the recording of the data by the measuring system. The Precitec Optronik MARK III software package makes it possible to perform comprehensive analyses of the topographical and profile data thus recorded.

Areas of Application

  • manufacturing and process control
  • quality assurance

research and development

 

NEMESIS P

Travel

25 mm x 25 mm

Maximum travel speed

20 mm/s

Positioning accuracy in travel direction, per axis

± 1 µm

Flatness/straightness per axis

± 0,5 µm

Z axis

manual adjustment

Sensor *)

CHR 150 E

Weight

2,250 g


*) Resolution and measurement accuracy depend on the measuring range of the sensor head:

 

Measuring range

300 µm

Resolution in Z

10 nm

Measurement accuracy

100 nm

NEMESIS

Optical surface measurement with the CHR 150 E optical distance sensor

  • topographies measured regardless of the nature of the surface (smooth and polished, rough, matte, transparent)
  • dimensional monitoring of ultra-small components and microstructures
  • thickness layer measurement of transparent objects
  • determination of roughness, waviness, load curves
  • measuring of optical components

 
Copyright © 2003 - 2004 Tet Makina